Prof. Zhang’s work in AMBER includes collaboration with Eblana on the Interface modification, measurement and processing for advanced manufacturing. He also collaborates with Intel and other companies to develop and apply microscopy methodologies to deliver a range of key enabling technologies to industry.
Prof. Hongzhou Zhang received MSc and PhD physics degrees from Peking University (China) and Rice University (US) in 1996 and 1999 respectively. During 2002 to 2004 he held a post-doctoral position at the National Laboratory of Mesoscopic Physics and Electron Microscopy (Peking University, China). In 2004 he became a research fellow in the Electronic Materials Engineering Department at the Australian National University (Australia). He joined CRANN as a Principal Investigator (PI) in 2009 and is now an Associate Professor at the School of Physics, Trinity College and a Principal Investigator at AMBER. He is also a Stokes Lecturer awardee.
He is a pioneering researcher in the field of helium-ion microscopy (HIM) and his research is focused on understanding He+-matter interaction with one/two-dimension materials in terms of signal generation/detection for imaging mechanism and structural modification for nanofabrication. His work in AMBER is to develop novel focused ion beam methods for the modification of laser diodes. This is a targeted project in collaboration with an Irish Industry partner, Eblana Photonics.